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Instrument Information

Brand: JEOL

Model: JSM-7600F

Brief description:

Field Emission Scanning Electron Microscope (FESEM) consist of:

• Secondary Electron Image Observation (SEI) – Secondary electrons are used to observe the topography of the specimen surface.
• Low Angle Backscattered Electron Image Observation (LABE) - Backscattered electrons are mainly used to observe the compositional differences of the specimen.
• EDS (Elemental) Analysis - This is a function to obtain a spectrum of the energy intensity of X-rays by using EDX- Oxford Instrument. All elements from B to U can be detected and measured simultaneously.
• Gentle Beam (GB) provides top-surface imaging with ultra-low energy incident electrons
   

Specifications:

Magnification : 25 to 1,000,000
Acce.voltage : 0.1kV to 30kV
Probe current : 1pA to 200Na

Sample criteria: Dry, non-magnetic, powder, thin film, solid

Location: , Room A124 ,Ground Floor, Block A Physics Department

Person in-charge

Supervisor: Mrs Nor Endang binti Ariffin (Phone no.: +603-79675174 / +60197552012)

Assistant Science Officer: Mrs. Nisrin binti Norannis

Assistant Science Officer: Ms.Nor Hazlizaaini binti Basri

Application Form :

• Form (UM User)
• Online Booking Form  (UM & Outsider User)

For further information regarding service charge, please click HERE.

Instrument Status :

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